Inverse determination of thermal conductivity using semi-discretization method

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Determination of porous Silicon thermal conductivity using the “Mirage effect” method

Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different  kind of samples , transverse photothermal deflection PTD in  skimming configuration with ccd camera  and special programs is used to determine thermal conductivity of porous silicon ps  film. Ps samples were prepared by electrochemical etching. Thermal conductivity wit...

متن کامل

Determination of porous Silicon thermal conductivity using the “Mirage effect” method

Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different  kind of samples , transverse photothermal deflection PTD in  skimming configuration with ccd camera  and special programs is used to determine thermal conductivity of porous silicon ps  film. Ps samples were prepared by electrochemical etching. Thermal conductivity wit...

متن کامل

Thermal Analysis of Convective-Radiative Fin with Temperature-Dependent Thermal Conductivity Using Chebychev Spectral Collocation Method

In this paper, the Chebychev spectral collocation method is applied for the thermal analysis of convective-radiative straight fins with the temperature-dependent thermal conductivity. The developed heat transfer model was used to analyse the thermal performance, establish the optimum thermal design parameters, and also, investigate the effects of thermo-geometric parameters and thermal conducti...

متن کامل

determination of porous silicon thermal conductivity using the “mirage effect” method

mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different  kind of samples , transverse photothermal deflection ptd in  skimming configuration with ccd camera  and special programs is used to determine thermal conductivity of porous silicon ps  film. ps samples were prepared by electrochemical etching. thermal conductivity wit...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Applied Mathematical Modelling

سال: 2009

ISSN: 0307-904X

DOI: 10.1016/j.apm.2008.03.001